[3dem] (mean Inner potential) Re: 3dem Digest, Vol 142, Issue 38

Benjamin Himes himes.benjamin at gmail.com
Mon Jun 17 11:45:48 PDT 2019


Hi Philip,

The mean inner potential (MIP) refers to a total "interaction" potential
that is considered a material property. It consists of all the sources
contributing to the potential well seen by an imaging electron, including
those you suggest (nuclear and electronic contributions.)

Yes, physical changes to the surface via adsorbed matter will directly
affect the MIP. I believe the working hypothesis for the source of the
"Volta" potential is through heat/exposure related modification of surface
adsorbates.

It is also interesting to note that in addition to the electronic character
of the object, the surface contributions of adsorbates and heating, there
is another thickness independent phase shift (at least for carbon) the
source of which I am not clear on. Happy to hear an explanation from anyone
in the know : )

Please have a look at this paper where all of the non-Volta contributions
are discussed and also measured.

*"Electron holography of thin amorphous carbon films: Measurement of the
mean inner potential and a thickness-independent phase shift"*

*doi: j.ultramic.2005.10.004*

HTH

Ben

------------------------
Benjamin Himes

cryoEM methods development
Grigorieff lab
<https://mail.hhmi.org/owa/redir.aspx?C=SbsCefkcbOt75jDyr05lpd3OifVN_utmfvnhZrtXS7Bl2i2eOXXVCA..&URL=http%3a%2f%2fgrigoriefflab.janelia.org%2f>,
HHMI Janelia Research Campus

cryoSTAC development @ emClarity
<https://mail.hhmi.org/owa/redir.aspx?C=8yDzXj54yTidMevTB7q5m3liEVwqAZ9LxuXQ4iYOVvtl2i2eOXXVCA..&URL=https%3a%2f%2fgithub.com%2fbHimes%2femClarity%2fwiki>

-------------------------


On Mon, Jun 17, 2019 at 12:17 PM <3dem-request at ncmir.ucsd.edu> wrote:

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> Today's Topics:
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>    1. mean inner potential of a solid (Philip K?ck)
>    2. NYC Computational Cryo-EM Summer Workshop
>       (Cindy Rampersad-Phillips)
>    3. side entry holder for autogrids? (Michael Elbaum)
>    4. Re: side entry holder for autogrids? (Wim Hagen)
>
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> ----------------------------------------------------------------------
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> Message: 1
> Date: Mon, 17 Jun 2019 08:27:35 +0000
> From: Philip K?ck <philip.koeck at ki.se>
> To: "3dem at ncmir.ucsd.edu" <3dem at ncmir.ucsd.edu>,
>         "microscopy at microscopy.com" <microscopy at microscopy.com>
> Subject: [3dem] mean inner potential of a solid
> Message-ID:
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>
>  Hi all.
>
> I've been wondering what the mean inner electrostatic potential of a solid
> (for example the 10 V of carbon) is actually due to.
> Is it purely caused by the distribution of nuclei and electrons in the
> solid itself or could there be a contribution from adsorbed surface charges?
>
> All the best,
>
> Philip
>
>
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> Message: 2
> Date: Mon, 17 Jun 2019 10:46:34 -0400
> From: Cindy Rampersad-Phillips <crampersad at flatironinstitute.org>
> To: 3dem at ncmir.ucsd.edu
> Subject: [3dem] NYC Computational Cryo-EM Summer Workshop
> Message-ID:
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> Dear 3D-EM group,
>
> We are organizing a 2-day workshop on "Computational Cryo-EM" which will
> take place at the Flatiron Institute, Simons Foundation, in New York City,
> on August 8-9, 2019. This summer workshop revives a tradition started by
> Joachim Frank and Gabor Herman many years ago. The topics will include:
> advances in reconstruction algorithms, software implementations and
> automation, motion correction, 2D/3D classification and continuous
> heterogeneity analysis, and related mathematical results and new problems.
> There will be 16 speakers in total, each giving 30-minute talks, in a
> workshop setting which promotes the open exchange of ideas. In addition,
> there will be a poster session.
>
> For more information, including the list of confirmed speakers, see the
> event website:
>
>
> https://www.simonsfoundation.org/event/nyc-computational-cryo-em-summer-workshop/
>
> To apply, please fill in the following registration form:
>
> https://indico.flatironinstitute.org/e/CryoEM
>
> Registration will be closed once we reach capacity, so please register soon
> to guarantee your attendance.
>
> On behalf of the organizing committee,
>
> Joakim And?n (Flatiron)
> Alex Barnett (Flatiron)
> Leslie Greengard (Flatiron / NYU)
> Roy Lederman (Yale)
> Amit Singer (Princeton)
> Marina Spivak (Flatiron)
>
> Regards,
> Cindy
> --
> Cindy Rampersad-Phillips
> Coordinator, Center for Computational Mathematics
>
> *Flatiron Institute*
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> Message: 3
> Date: Mon, 17 Jun 2019 16:00:45 +0000
> From: Michael Elbaum <michael.elbaum at weizmann.ac.il>
> To: "3dem at ncmir.ucsd.edu" <3dem at ncmir.ucsd.edu>
> Subject: [3dem] side entry holder for autogrids?
> Message-ID: <77389ED5A5E5A947A5FEA1B9E8D512CB01961EB25D at ibwmbx03>
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> Hi all,    wondering if anyone has heard/thought/dreamed of a side entry
> holder for clipped grids? This would be very useful in mixed company (of
> microscopes, of course), and could enable analysis of grids post-tomography
> by non-standard methods such as EDS. Perhaps someone has experience in
> modifying a 626 tip for the purpose?
> regards,
> Michael
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> Message: 4
> Date: Mon, 17 Jun 2019 18:16:32 +0200
> From: Wim Hagen <hagen at embl.de>
> To: "3dem at ncmir.ucsd.edu" <3dem at ncmir.ucsd.edu>
> Subject: Re: [3dem] side entry holder for autogrids?
> Message-ID: <44A00032-E921-429F-8BD0-03AA24FEC02A at embl.de>
> Content-Type: text/plain; charset="utf-8"
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> Hi Michael,
>
> I?ve discussed this with Chris Booth from Gatan some time ago, a multiple
> cartridge side entry holder will for sure also help a lot of people with
> side-entry screening systems, preparing for later data collection  in
> central facilities. With other people?s ideas for cheap side-entry low-kv
> screening tools, this could be quite a market.
>
> Best,
>
> Wim Hagen
> EMBL Heidelberg
>
> > On 17. Jun 2019, at 18:00, Michael Elbaum <michael.elbaum at weizmann.ac.il>
> wrote:
> >
> > Hi all,    wondering if anyone has heard/thought/dreamed of a side entry
> holder for clipped grids? This would be very useful in mixed company (of
> microscopes, of course), and could enable analysis of grids post-tomography
> by non-standard methods such as EDS. Perhaps someone has experience in
> modifying a 626 tip for the purpose?
> > regards,
> > Michael
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