[3dem] Stanford EM-X Symposium - May 5, 2025

Dunn, Lisa B. lisa at slac.stanford.edu
Mon Apr 21 08:38:34 PDT 2025


We are pleased to invite you to our May 2025 Stanford Electron Microscopy-X (EM-X) Symposium on Monday May 5th, 2025, 8-9:30am (PDT).

Speakers:

Dr. Richard Leapman
Scientific Director at the National Institute of Biomedical Imaging & Bioengineering (NIBIB), USA
Talk Title: Imaging 3D Ultrastructure of Entire Eukaryotic Cells Using vEM: Capabilities and Physical Limits
Bio: Dr. Richard Leapman is the Scientific Director of the Intramural Program of the National Institute of Biomedical Imaging and Bioengineering (NIBIB) at the National Institutes of Health (NIH), while also heading NIBIB's Laboratory of Cellular and Supramolecular Structure and Function. He has received several awards including the Microscopy Society of America Distinguished Scientist Award in 2018. More recently, he and his research group have contributed to developing the volume EM techniques of focused ion beam scanning electron microscopy (FIB-SEM) and serial block face scanning electron microscopy (SBF-SEM), which provide three-dimensional ultrastructure of entire eukaryotic cells and tissues, and he has provided an improved understanding of the capabilities and limitations of these techniques.

Dr. Vesna Srot
Senior Scientist at the Max Planck Institute for Solid State Research, Stuttgart, Germany
Talk Title: Advancing In-Situ Sample Preparation for MEMS-Based Electrical and Electro-Thermal (S)TEM Characterization
Bio: Dr. Vesna Srot obtained her PhD in geology/mineralogy from the University of Ljubljana, Slovenia. She continued with postdoctoral study at the Max Planck Institute in Stuttgart, Germany. Since 2015 she is employed as a research scientist at the Max Planck Institute for Solid State Research, Stuttgart, Germany. Her research topics include sample preparation of hybrid organic-inorganic biological and bio-inspired materials and advanced imaging and analytical (S)TEM characterization, as well as method development for MEMS-based in-situ sample preparation and (S)TEM investigations of functional materials by in-situ electrical-biasing and electro-thermal experiments.

We expect a large attendance. Please register soon at https://urldefense.com/v3/__https://stanford.zoom.us/webinar/register/WN_vXcipB2yR9O3T1DDfxflJQ__;!!Mih3wA!GqtTrj-Nz4FOEqiI_OCXfm84hvdWOCznOjhIJrbrFdSdgkPhi5QPTqcSDSa2GKGcsatBkr4rf3FP6PZT603Ax2Y$  and visit our official website at https://urldefense.com/v3/__https://emx.stanford.edu/__;!!Mih3wA!GqtTrj-Nz4FOEqiI_OCXfm84hvdWOCznOjhIJrbrFdSdgkPhi5QPTqcSDSa2GKGcsatBkr4rf3FP6PZTIMjpv-k$ <https://urldefense.com/v3/__https:/emx.stanford.edu/__;!!Mih3wA!BMu3xztXxV7y1hrKG3tPpGqn91hHL6pZ96xu7j8vTWwkHyCbOzBGRE29K5ZOHB91WkNXbQlHO7aU-YgHRoZQMNV3Zl4$> andhttps://emx.stanford.edu/previous-speakers<https://urldefense.com/v3/__https:/emx.stanford.edu/previous-speakers__;!!Mih3wA!BMu3xztXxV7y1hrKG3tPpGqn91hHL6pZ96xu7j8vTWwkHyCbOzBGRE29K5ZOHB91WkNXbQlHO7aU-YgHRoZQaooPmmU$> to see our previous speakers.

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