[3dem] Ask the Experts: Targeted FIB sample preparation - Wed, Aug 19, 2020 17:00 CEST

[Kasim Sader]

Dear 3DEM and CCPEM,
Please see the information and registration below for the upcoming Ask the
Experts session next Wednesday August 19th, 2020.
Best regards,
Kasim


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[image: Thermo Fisher Scientific]
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*Join this special joint session with Leica on targeted focused ion beam
(FIB) milling*

*Wed, Aug 19, 2020 17:00 CEST | 11 a.m. EDT | 10 a.m. CDT | 8 a.m. PDT*



Attend our upcoming *Ask the Experts* Q&A session on targeted focused ion
beam (FIB) sample preparation based on cryo-fluorescence microscopy data.
Ask questions, get answers, and engage with experts from both Thermo Fisher
Scientific and Leica during this special joint session.



You’ll learn about:

•

Integrating cryo-fluorescence microscopy into the cryo-electron tomography
workflow

•

Widefield and confocal cryo-fluorescence microscopy for localizing
fluorescent signals

•

Cryo-FIB milling



* Register today *
<https://urldefense.com/v3/__http://app.em.thermofisher.com/e/er?s=34830204&lid=3646&elqTrackId=fa281aa349484664bbf0bdec04780d25&elq=47b11c6b6867423bb445763ff3670242&elqaid=1297&elqat=1__;!!Mih3wA!UKo20LJ7-Akeeejbv2kvG3ZgK8pplsc4qZqCjfnzxi875YCIr59BiplAF7JWi504cw$ >





*Presenter information*



*Host:*
Kasim Sader, Application Manager, Thermo Fisher Scientific



*Panelists:*
Bernhard Goetze, Product Marketing Director, Thermo Fisher Scientific
Alex Rigort, Product Marketing Manager, Thermo Fisher Scientific
Jan De Bock, Application Manager, Leica

Robert Kirmse, Senior Manager, Leica





Register now ›
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