[3dem] symposium “Advances 3D electron microscopy” at the Microscopy and Microanalysis conference

[Niels de Jonge]

We invite you to symposium A10: “Advances 3D electron microscopy” at the Microscopy and Microanalysis conference in Nashville, TN, USA, Aug 7-11, 2011.
http://www.microscopy.org/MandM/2011/
Please note that the abstract submission deadline is: February 15, 2011.

This symposium will cover:
·      New technological developments in 3D electron microscopy (EM)
·      Applications in both biology and materials science
·      Advances in tilt-series tomography, and single-particle reconstruction
·      3D EM using novel approaches such as phase plates, STEM tomography, focal-series STEM, and 3D FIB-SEM
·      Advances in data processing, analysis, and structure prediction

Invited speakers are:
·      Joost Batenburg, CWI, Netherlands
·      Mark Ellisman, University of California, San Diego, CA, USA
·      Heiner Friedrich, Eindhoven University of Technology, Netherlands
·      Werner Kuhlbrandt, Max Planck Institute of Biophysics, Germany
·      Richard Leapman, NIBIB, NIH, USA
·      Andrew Lupini, Oak Ridge National Laboratory, USA
·      Jens Meiler, Vanderbilt University, USA
·      Paul Midgley, University of Cambridge, UK
·      Jürgen Plitzko, Max Planck Institute of Biochemistry, Germany

Thank you very much,
Niels de Jonge, Christian Kuebel, and Alioscka Sousa
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