[3dem] symposium “Advances 3D electron microscopy” at the Microscopy and Microanalysis conference
Niels de Jonge
niels.de.jonge at Vanderbilt.Edu
Wed Jan 26 19:39:08 PST 2011
We invite you to symposium A10: “Advances 3D electron microscopy” at the Microscopy and Microanalysis conference in Nashville, TN, USA, Aug 7-11, 2011.
http://www.microscopy.org/MandM/2011/
Please note that the abstract submission deadline is: February 15, 2011.
This symposium will cover:
· New technological developments in 3D electron microscopy (EM)
· Applications in both biology and materials science
· Advances in tilt-series tomography, and single-particle reconstruction
· 3D EM using novel approaches such as phase plates, STEM tomography, focal-series STEM, and 3D FIB-SEM
· Advances in data processing, analysis, and structure prediction
Invited speakers are:
· Joost Batenburg, CWI, Netherlands
· Mark Ellisman, University of California, San Diego, CA, USA
· Heiner Friedrich, Eindhoven University of Technology, Netherlands
· Werner Kuhlbrandt, Max Planck Institute of Biophysics, Germany
· Richard Leapman, NIBIB, NIH, USA
· Andrew Lupini, Oak Ridge National Laboratory, USA
· Jens Meiler, Vanderbilt University, USA
· Paul Midgley, University of Cambridge, UK
· Jürgen Plitzko, Max Planck Institute of Biochemistry, Germany
Thank you very much,
Niels de Jonge, Christian Kuebel, and Alioscka Sousa
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